LIALO2
- Company Name:Shanghai LaserMa Crystals Inc.
- Membership:Free Member
- Member Since:2008. 05.23
- Country/Region:China
- City:Shanghai
- Contact:Hellen
- Related Keywords:Lithium Aluminium Oxide, Czockralski, GaN epitaxial film, substrate
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Shanghai LaserMa Crystals Inc.
[China]
The lattice parameter of Lithium Aluminium Oxide (γ) (LiAlO2) crystal can match with the Gallium Nitride film very well. The mismatch coefficients are 0.2% and 1.4% only for LiAlO2, much smaller than that of the common used substrates such as <0001> sapphire (14%), <100> MgO (3%), <0001> SiC (3.5%). The Gallium Nitride film is a very important material for blue, violet, UV and white LED. A substrate material that matches the film to be grown well is very important to get a nice GaN epitaxial film. 1.Crystal Property Substrate LiAlO2 Crystal structure 422 tetragonal Cell parameter a=5.1687 ? c=6.2676 ? Melting point(°K) 1973 Density (g/cm3) 2.615 Thermal expansion(x10-6k-1) αa=7.1 αc=15 (393-973°K) Hardness(Mohs) 6.5 Growth Method Czockralski 2. Main Specifications: Orientation: <100>, <110>,<111> Orientation accuracy: ±0.5° Edge Orientation accuracy: 2°(or 1°for special order) Thickness tolerance: ±0.02mm Or ±0.005mm Cut with special tilt angle: available(tilt angle:1°-45°) Standard Size: Ф20, 20x20,10x10,10x5,10x3mm Thickness: 0.5mm 1.0mm. Dimension Tolerance +/-0.05mm Faltness: λ/4@633nm Micro roughness (5μm?μm) Ra:≤5? Parallelism < 30 arc Sec. AR coatinfg R<0.2% at centret wavlength
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